Experiments in Integrated Circuit Development

Experiments in Integrated Circuit Development
Measurements of key silicon properties and fabrication of integrated circuits.
EC EN
452
 Hours1.0 Credit, 0.0 Lecture, 3.0 Lab
 PrerequisitesEC En 450 or concurrent enrollment; or Ch En 381 or concurrent enrollment.
 TaughtWinter
 ProgramsContaining EC EN 452
Course Outcomes

Fabricated Devices

Ability to analyze and interpret data measured from fabricated devices.

MOSFET Devices

Ability to design processes for fabrication of MOSFET devices.

Tools

Ability to use modern microelectronics fabrication equipment.