Course Outcomes
Please contact the individual department for outcome information.
Scanning Electron Microscopy (SEM) for Physical Science and Engineering
Scanning Electron Microscopy (SEM) for Physical Science and Engineering
Theoretical aspects of sample preparation, basic and advanced imaging, X-ray energy dispersive spectrometry, and other analytical materials characterization techniques on the scanning electron microscope (SEM).
| Hours | 3.0 Credit, 2.0 Lecture, 3.0 Lab |
| Prerequisites | None |
| Taught | Fall |
