Scanning Electron Microscopy (SEM) for Physical Science and Engineering

Scanning Electron Microscopy (SEM) for Physical Science and Engineering
Theoretical aspects of sample preparation, basic and advanced imaging, X-ray energy dispersive spectrometry, and other analytical materials characterization techniques on the scanning electron microscope (SEM).
PHSCS
588
 Hours3.0 Credit, 2.0 Lecture, 3.0 Lab
 PrerequisitesNone
 TaughtFall
Course Outcomes

Please contact the individual department for outcome information.